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Recent Advances in PMOS Negative Bias Temperature Instability
Characterization and Modeling of Device Architecture, Material and Process Impact

Cover image: Recent Advances in PMOS Negative Bias Temperature Instability 9789811661198
  • Publisher
    Springer
  • Format
    Reflowable Layout
  • Print ISBN 9789811661198, 9811661197
  • eText ISBN 9789811661204, 9811661200
  • Copyright
    2022
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Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material and Process Impact and published by Springer. The Digital and eTextbook ISBNs for Recent Advances in PMOS Negative Bias Temperature Instability are 9789811661204, 9811661200 and the print ISBNs are 9789811661198, 9811661197. Save up to 80% versus print by going digital with VitalSource.

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