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Defect Recognition and Image Processing in Semiconductors 1997 1st Edition
Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, September 1997

Cover image: Defect Recognition and Image Processing in Semiconductors 1997 1st edition 9780750305006
  • Author(s)
    J. Doneker
  • Publisher
    Routledge
  • Format
    Reflowable Layout
  • Print ISBN 9780750305006, 0750305002
  • eText ISBN 9781351456463, 1351456466
  • Edition
    1st
  • Copyright
    1998
eTextbook License
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€290.00 EUR
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Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, September 1997 1st Edition is written by J. Doneker and published by Routledge. The Digital and eTextbook ISBNs for Defect Recognition and Image Processing in Semiconductors 1997 are 9781351456463, 1351456466 and the print ISBNs are 9780750305006, 0750305002. Save up to 80% versus print by going digital with VitalSource. Additional ISBNs for this eTextbook include 9781315140810, 9781351456456, 9781351456470.

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